2024年
10/09
開催
開催日時
2024/10/09（水）16:00〜17:30
開催場所
J-PARC制御棟打ち合わせ室 + zoom
講演者
Salvatore Danzeca氏 (CERN)
言語
英語
詳細ページ
お問い合わせ
大森 千広 (PHS 4784)
概要
Radiation effects on electronics are a significant challenge inparticle accelerators, where systems are exposed to complex and intenseradiation fields. The Electronic Production and Radiation Tolerance(EPR) section at the CERN Beams department, addresses these challengesthrough several activities that includes radiation monitoring, RadiationHardness Assurance (RHA), and the operation of radiation testingfacilities.
Radiation monitoring systems, such as RadMon and IoT Wireless devices,provide critical real-time data on radiation fields, which form thebasis for assessing the effects on electronics. These measurements areintegral to the RHA process, which ensures that electronic componentscan withstand the demanding conditions within particle accelerators.Collaboration between J-PARC and CERN extends the application of thesedevices beyond CERN accelerators, to other particle accelerators andtest facilities.
The RHA process at CERN begins at the very early stages of electronicsystem development and follows the system through its entire life cycle,aiming at reducing risks to critical devices while maintainingcost-effectiveness and performance. This procedure focuses on qualifyingcomponents versus both single event effects and cumulative radiationdamage, always considering the unique radiation environment of particleaccelerators.
To meet the requirements of RHA, specialized facilities are needed tosimulate the complex radiation fields found in accelerators. The CHARMfacility at CERN, coordinated and operated by the EPR section, plays apivotal role in this process. CHARM enables testing of electroniccomponents under realistic radiation conditions, providing the necessaryenvironment to evaluate their resilience and performance.
The integration of reliable radiation measurements, robustqualification processes, and access to advanced facilities like CHARMsupports the development of resilient and reliable electronics inradiation-harsh environments of particle accelerators.