Sensor-device development & microscopy

分類測定器開発室セミナー
開始2015/04/23(木)13:00
終了2015/04/23(木)14:30
会場3号館4階会議室 425
講演タイトルSensor-device development & microscopy
講演者Prof. Cathal Cassidy(OIST)
言語英語/English
連絡先arai.yasuo -at- kek.jp
ウェブサイトhttp://rd.kek.jp/seminar_01.html
食堂・売店利用予定なし/0

概要

Abstract:
In the first part of this talk, I will introduce the 3D sensor-CMOS integration technology that we developed at ams AG in the period from 2006-2012, for medical imaging application. I will discuss process development, structure, microscopy, and strengths and limitations of the technology. In the second part of the talk, I will discuss activities at OIST in the period 2012-2015, with a focus on advanced electron microscopy capabilities and results. These include semiconductor nanoparticle TEM and GPA strain analysis, high temperature TEM, holography, and in operando device TEM. In conclusion, I will briefly mention possible topics for future research in CMOS-detector technology.

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