R&D on Counting Pixel Chips

分類測定器開発室セミナー
開始2015/01/28(水)16:00
終了2015/01/28(水)17:30
会場3号館3階会議室
講演タイトル
講演者Dr. Yunpeng Lu (IHEP)
言語英語/English
連絡先
ウェブサイト
食堂・売店/0

概要

Shielding is a key issue in SOI pixel technology and counting
pixel is an effective measure to study it. In addition, counting pixel is getting more
and more porpular in synchrotron radiation application. IHEP group joined this R&D
effort since 2012, and submitted two chips so far. One adopted nested-wells and
the second adopted double SOI to implement shielding. After two iterations, different
circuit and shielding scheme have been designed and tested. The results and
improvement considerations will be introduced in this talk.

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