Sensor-device development & microscopy

  • 分類 測定器開発室セミナー
  • 開始 2015/04/23(木)13:00
  • 終了 2015/04/23(木)14:30
  • 会場 3号館4階会議室 425
  • 講演タイトル Sensor-device development & microscopy
  • 講演者 Prof. Cathal Cassidy(OIST)
  • 言語 英語/English
  • 連絡先 arai.yasuo -at- kek.jp
  • ウェブサイトhttp://rd.kek.jp/seminar_01.html
  • 食堂・売店 利用予定なし/0

概要

Abstract:
In the first part of this talk, I will introduce the 3D sensor-CMOS integration technology that we developed at ams AG in the period from 2006-2012, for medical imaging application. I will discuss process development, structure, microscopy, and strengths and limitations of the technology. In the second part of the talk, I will discuss activities at OIST in the period 2012-2015, with a focus on advanced electron microscopy capabilities and results. These include semiconductor nanoparticle TEM and GPA strain analysis, high temperature TEM, holography, and in operando device TEM. In conclusion, I will briefly mention possible topics for future research in CMOS-detector technology.