DTP Seminar

Sensor-device development & microscopy

Start:2015/04/23 (Thu) 1:00 PM
End:2015/04/23 (Thu) 2:30 PM
Location:Meeting room in 4th floor, bldg. 3 (425)

Speaker:Prof. Cathal Cassidy(OIST)
Lecture:Sensor-device development & microscopy
Language:英語/English
Contact:arai.yasuo -at- kek.jp

Abstract:

Abstract:
In the first part of this talk, I will introduce the 3D sensor-CMOS integration technology that we developed at ams AG in the period from 2006-2012, for medical imaging application. I will discuss process development, structure, microscopy, and strengths and limitations of the technology. In the second part of the talk, I will discuss activities at OIST in the period 2012-2015, with a focus on advanced electron microscopy capabilities and results. These include semiconductor nanoparticle TEM and GPA strain analysis, high temperature TEM, holography, and in operando device TEM. In conclusion, I will briefly mention possible topics for future research in CMOS-detector technology.

WEBsite:
http://rd.kek.jp/seminar_01.html

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